Nikon Instruments Introduces LV-DAF for Full System Integration with Eclipse LV Microscope Series

2008-07-15 10:42:00

  Nikon's New Dynamic Auto-Focus Unit Delivers Fast, Versatile Auto-Focus

                    Using Novel Hybrid Auto-Focus System



    MELVILLE, N.Y., July 15 /EMWPresswire/ -- Nikon Instruments Inc.

(http://www.nikoninstruments.com/) announced its new Dynamic Auto-Focus

unit, the LV-DAF, bringing fast, versatile auto-focus to the Eclipse LV

semiconductor inspection microscope series and OEM applications. Featuring

the newly developed Hybrid Auto-Focus system, the LV-DAF offers a large

focus range and fast tracking ability through a combination of slit

projection and contrast detection auto focus. The result is a

highly-versatile system that can be used for a wide range of imaging

techniques.



    In pairing the two auto-focus technologies, the LV-DAF provides a focal

range that is significantly larger than with contrast detection alone. This

means that samples with distortion on their surface, such as liquid crystal

substrate, can now be rapidly tracked, enabling speedy focusing. To further

support sample variety, the LV-DAF uses a bright light LED for the

auto-focus light source. This allows the system to focus on wide range of

samples ranging from low to high reflectivity. A wide range of observation

methods is also supported, including brightfield, darkfield and

differential interference contrast (DIC), as well as reflective and

transparent samples.



    "The LV microscopes are known for their unprecedented versatility for

OEM applications as well as for wafer inspection," said Mike Metzger,

General Manager, Sales and Marketing. "In developing the LV-DAF, Nikon has

been able to expand those offerings even further and provide superior

options to our industrial customers."



    The Auto-Adjustment Program, which is included as standard, enables

simple and speedy system setup. The program performs immediate

auto-adjustment after the user focuses the system and presses the button to

start the setup. It is also possible to automatically set optimal

parameters for each type of sample and recall them in accordance to the

sample being photographed.



    The LV-DAF can be controlled from a PC or a DS-L2 digital camera system

for microscopes via USB or RS232C. The controller features the same

hardware design as the LV-ECON and has a compact footprint that allows them

to be stacked on each other and used anywhere. Additionally, Nikon provides

a software development kit to help ease integration of the LV-DAF into a

variety of systems.



    About Nikon Instruments Inc.



    Nikon Instruments Inc. is a world leader in the development and

manufacture of optical and digital imaging technology for biomedical and

industrial applications. Now in its 90th year, Nikon provides complete

optical systems that offer optimal versatility, performance and

productivity. Cutting-edge instruments include microscopes, precision

measuring equipment, digital imaging products and software. Nikon

Instruments is the microscopy and instrumentation arm of Nikon Inc., the

world leader in digital imaging, precision optics and photo imaging

technology. For more information, visit http://www.nikoninstruments.com.

Product-related inquiries may be directed to Nikon Instruments at

800-52-NIKON.





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